Noncontact Atomic Force Microscopy: Volume 3 by Seizo Morita (English) Paperback-image

Noncontact Atomic Force Microscopy: Volume 3 by Seizo Morita (English) Paperback

$ 249.67

Type: NA gtin13: 9783319358765 ISBN-13: 9783319358765 ISBN: 9783319358765 Publication Name: NA

Description

The Nile on eBay FREE SHIPPING UK WIDE Noncontact Atomic Force Microscopy by Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. FORMAT Paperback LANGUAGE English CONDITION Brand New Back Cover This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. Table of Contents From the Contents: Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy. Feature Represents a most advanced state-of-the-art report on atomic force microscopy and scanning tunneling microscopy Deals with the various classes of materials studied at the atomic scale A valuable reference for researchers as well as a text for graduate students Written by leading researchers in the field Details ISBN 3319358766 Year 2016 ISBN-10 3319358766 ISBN-13 9783319358765 Format Paperback Language English Media Book DEWEY 620.5 Imprint Springer International Publishing AG Subtitle Volume 3 Place of Publication Cham Country of Publication Switzerland Edited by Roland Wiesendanger Pages 527 Publication Date 2016-10-13 Short Title Noncontact Atomic Force Microscopy Author Roland Wiesendanger Birth 1974 Affiliation University of Minnesota School of Law Position EDFRTR Qualifications PhD Publisher Springer International Publishing AG Edition Description Softcover reprint of the original 1st ed. 2015 Series NanoScience and Technology Alternative 9783319155876 Audience Professional & Vocational Country of Origin NL Product Class Description Mechanical Engineering Illustrations 159 Illustrations, color; 97 Illustrations, black and white We've got this At The Nile, if you're looking for it, we've got it. With fast shipping, low prices, friendly service and well over a million items - you're bound to find what you want, at a price you'll love! 30 DAY RETURN POLICY No questions asked, 30 day returns! FREE DELIVERY No matter where you are in the UK, delivery is free. SECURE PAYMENT Peace of mind by paying through PayPal and eBay Buyer Protection TheNile_Item_ID:137805732;

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