Productivity Analysis at the Organizational Level, Paperback by Adam, Nabil R...

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Series: Studies in Productivity Analysis Ser. ISBN: 9789400981287 Number of Pages: IX, 181 Pages Subject Area: Business & Economics Subject: Operations Research Publication Name: Productivity Analysis at the Organizational Level Language: English Item Length: 9.3 in Format: Trade Paperback width: 6.1 in Book Title: Productivity Analysis at the Organizational Level Item Width: 6.1 in Item Weight: 10.9 Oz Author: Ali Dogramaci Publication Year: 2011 Publisher: Springer Netherlands Type: Textbook

Description

Productivity Analysis at the Organizational Level, Paperback by Adam, Nabil R.... The objective of this book is to provide the reader with a sample of original papers that relate to these productivity topics at the organizational level. Productivity Analysis at the Organizational Level, Paperback by Adam, Nabil R. (EDT); Dogramaci, Ali (EDT), ISBN 9400981287, ISBN-13 9789400981287, Brand New, Free shipping in the US 1 Nabil R. Adam and Ali Dogramaci Measuring, analyzing, and improving productivity in a given organization is a complex process that involves the contributions of economists, industrial engineers, operations researchers, management scientists, and lawyers. The objective of this book is to provide the reader with a sample of original papers that relate to these productivity topics at the organizational level. In th, the word organization refers to business firms and municipal organizations. The hook is divided into three parts: perspectives on productivity mea surement, a range of studies at the micro level, and some productivity issues in public organizations. Part I, which consists of three chapters, deals with productivity measurement. The first two chapters of this part cover a broad framework of measurement concepts and techniques; the last chapter, on the other hand, provides the reader with an example of productivity measurement for a specific industry (in this case, food retail ing). Thus, a spectrum of productivity measurement issues is covered in this part of th.