Noncontact Atomic Force Microscopy: Volume 2 by Seizo Morita (English) Hardcover-image

Noncontact Atomic Force Microscopy: Volume 2 by Seizo Morita (English) Hardcover

$ 196.51

Language: English Publication Year: 2009 Number of Pages: Xviii, 401 Pages Publication Name: Noncontact Atomic Force Microscopy : Volume 2 Format: Hardcover Item Width: 6.1 in Author: Franz J. Giessibl Subject Area: Technology & Engineering, Science Item Weight: 30.7 Oz Publisher: Springer Berlin / Heidelberg Series: Nanoscience and Technology Ser. ISBN: 9783642014949 Item Length: 9.3 in gtin13: 9783642014949 Type: Textbook ISBN-13: 9783642014949 Book Title: Noncontact Atomic Force Microscopy Subject: Spectroscopy & Spectrum Analysis, Electron Microscopes & Microscopy, Chemistry / Physical & Theoretical, Nanotechnology & Mems

Description

Noncontact Atomic Force Microscopy by Seizo Morita, Franz J. Giessibl, Roland Wiesendanger Estimated delivery 3-12 business days Format Hardcover Condition Brand New Description Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; Publisher Description Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology. Details ISBN 3642014941 ISBN-13 9783642014949 Title Noncontact Atomic Force Microscopy Author Seizo Morita, Franz J. Giessibl, Roland Wiesendanger Format Hardcover Year 2009 Pages 401 Edition 2009th Publisher Springer-Verlag Berlin and Heidelberg GmbH & Co. KG GE_Item_ID:137678606; About Us Grand Eagle Retail is the ideal place for all your shopping needs! With fast shipping, low prices, friendly service and over 1,000,000 in stock items - you're bound to find what you want, at a price you'll love! Shipping & Delivery Times Shipping is FREE to any address in USA. Please view eBay estimated delivery times at the top of the listing. Deliveries are made by either USPS or Courier. We are unable to deliver faster than stated. International deliveries will take 1-6 weeks. NOTE: We are unable to offer combined shipping for multiple items purchased. This is because our items are shipped from different locations. Returns If you wish to return an item, please consult our Returns Policy as below: Please contact Customer Services and request "Return Authorisation" before you send your item back to us. Unauthorised returns will not be accepted. Returns must be postmarked within 4 business days of authorisation and must be in resellable condition. Returns are shipped at the customer's risk. We cannot take responsibility for items which are lost or damaged in transit. For purchases where a shipping charge was paid, there will be no refund of the original shipping charge. Additional Questions If you have any questions please feel free to Contact Us. Categories Baby Books Electronics Fashion Games Health & Beauty Home, Garden & Pets Movies Music Sports & Outdoors Toys

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